![Figure 1 from Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching ( UIS ) Stress Condition | Semantic Scholar Figure 1 from Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching ( UIS ) Stress Condition | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/459d8cb1864bff806b9043bc304c96eeb106c1a4/1-Figure1-1.png)
Figure 1 from Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching ( UIS ) Stress Condition | Semantic Scholar
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Reliability investigation of repeated unclamped inductive switching in a diode-clamped SiC circuit breaker - ScienceDirect
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Avalanche Ruggedness of SiC MPS Diodes Under Repetitive Unclamped-Inductive- Switching Stress - Technical Articles
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Dynamic avalanche behavior of power MOSFETs and IGBTs under unclamped inductive switching conditions
Fayyaz, A. and Yang, L. and Riccio, M. and Castellazzi, A. and Irace, A. (2014) Single pulse avalanche robustness and repetitive
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Applied Sciences | Free Full-Text | Analysis of Ruggedness of 4H-SiC Power MOSFETs with Various Doping Parameters
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Avalanche Ruggedness of SiC MPS Diodes Under Repetitive Unclamped-Inductive- Switching Stress - Technical Articles
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Materials | Free Full-Text | Charge Trap States of SiC Power TrenchMOS Transistor under Repetitive Unclamped Inductive Switching Stress
![b) compares the unclamped inductive switching waveforms for the studied... | Download Scientific Diagram b) compares the unclamped inductive switching waveforms for the studied... | Download Scientific Diagram](https://www.researchgate.net/publication/349419846/figure/fig3/AS:992739592253440@1613698971270/b-compares-the-unclamped-inductive-switching-waveforms-for-the-studied-MOSFETs-where.png)
b) compares the unclamped inductive switching waveforms for the studied... | Download Scientific Diagram
![Figure 2 from Small current unclamped inductive switching (UIS) to detect fabrication defect for mass-production phase IGBT | Semantic Scholar Figure 2 from Small current unclamped inductive switching (UIS) to detect fabrication defect for mass-production phase IGBT | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/d4ba2bdba1f283d51b3e8ef47a0c5b8a9f87848d/2-Figure2-1.png)
Figure 2 from Small current unclamped inductive switching (UIS) to detect fabrication defect for mass-production phase IGBT | Semantic Scholar
![Typical test setup for unclamped inductive switching. The DUT is in... | Download Scientific Diagram Typical test setup for unclamped inductive switching. The DUT is in... | Download Scientific Diagram](https://www.researchgate.net/publication/344029127/figure/fig1/AS:936586816536576@1600311106272/Typical-test-setup-for-unclamped-inductive-switching-The-DUT-is-in-avalanche-during-the.png)
Typical test setup for unclamped inductive switching. The DUT is in... | Download Scientific Diagram
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